
NEX QC+
For demanding applications or critical measurement times, the NEX QC+ model includes an SDD for enhanced resolution, faster measurements, and higher precision.
| Technique | Direct excitation EDXRF |
|---|---|
| Benefit | Performance and affordability; analysis of solids, liquids, powders, alloys, and thin films |
| Technology | High-performance Si-PIN detector (NEX QC) or SDD (NEX QC+) |
| Attributes | 50 kV 4 W X-ray tube, embedded computer, touchscreen interface, built-in printer |
| Options | Helium purge, automatic sample changers, portable case |
| Dimensions | 31 mm (W) x 376 mm (H) x 432 mm (D) |
| Weight | Approx. 16 kg |
| Power Supply | 1Ø, 100–240 V, 1.4 A (50/60 Hz) |
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