LEAP 5000 R/XR

High Performance 3D Atom Probe for Advanced Materials and Metals Applications

The LEAP 5000 R/XRTM is a high performance 3D atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of simple and complex structures with atom by atom identification and accurate spatial positioning.
The system works using the principle of field evaporation, whereby a strong electric field applied to the specimen is sufficient to cause removal of atoms by ionization. Atom removal is triggered either via a voltage or laser pulse applied to the sample.

The LEAP 5000 R/XR provides the following key features:

Available in voltage + laser pulsed modes (XR), or voltage pulsing only (R)
Excellent field of view with good mass resolution
Local electrode and microtip compatibility
Best signal to noise performance
New high performance pulsing system