LEAP 5000

3D Atom Probe Microscope with unmatched 3D sub-nanometer analytical performance.

The LEAP 5000 is CAMECA's cutting-edge atom probe microscope, offering superior detection efficiency across a wide variety of metals, semiconductors and insulators: more than 40% extra atoms detected per nm3 analyzed!

Increased analysis volumes & detection efficiency
Unparalleled compositional precision & accuracy
Greater productivity & ease-of-use

The LEAP 5000 platform collects nanoscale information from a microscale dataset in just a few hours!

LEAP 5000

>> Increased detection efficiency provides unparalleled sensitivity
>> Improved Field-of-View and detection uniformity - the ultimate 3D spatial resolution
>> Enhanced multi-hit detection capabilities for the most accurate compositional measurements
>> Faster and variable repetition rate for ultra-high speed data acquisition
>> New robust & ergonomic platform for increased ease-of-use and reduced time-to-knowledge
>> Live-time monitoring to ensure the highest quality data in every measurement
>> Advanced laser control algorithms provide measurably improved sample yields