
alpha300 RA – Combination of Chemical and Nanoscale Structural Imaging in one System
The well-established Raman-AFM combination alpha300 RA was the first integrated Raman AFM system on the market and continues to set the standard for combined instrument configurations for correlative Raman-AFM microscopy. The alpha300 RA incorporates the features of the Raman microscopy system alpha300 R for powerful chemical imaging along with Atomic Force Microscopy (alpha300 A) for high-resolution nanoscale surface characterization. Thus correlative Raman AFM imaging facilitates a comprehensive understanding of the samples.
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ankara@tetratek.com.trBalmumcu Mah. Bestekar Şevki Bey Sokak No:32 34349 Balmumcu - Beşiktaş / İSTANBUL
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izmir@tetratek.com.tr